About
This is the initial release of the Semiconductor Test Library. The attached release assets below include the Semiconductor Test Library NuGet package, the standalone output assembly files, and source code.
The Semiconductor Test Library simplifies programming on the NI Semiconductor Test System (STS) and enables users to develop test programs efficiently using C#/.NET.
Features
The Semiconductor Test Library includes the following high-level features:
- Interfaces and classes—Abstract instrument sessions and encapsulate the necessary pin and site awareness.
- Pin- and site-aware data types— Simplify instrument configuration and measurement results processing.
- Extension methods—Abstract common, high-level instrument operations.
- Parallelization methods—Abstract parallel for loops required to iterate over multiple instrument sessions regardless of how sessions map to pins or sites.
- Publishing methods—Simplify results publishing and add support for the SiteData and PinSiteData types.
- Utilities methods—Provide utility methods commonly required for writing test code.
- TestStand steps—Perform common operations, such as setting up and closing instruments, powering up a DUT, or executing common tests.
Documentation
A complete set of documentation for the Semiconductor Test Library, including features and support instrument types, can be found here: https://ni.github.io/semi-test-library-dotnet
Software Requirements
The Semiconductor Test Library requires STS Software 24.5 or later and .NET Framework 4.8 or later.