Skip to content

Latest commit

 

History

History
59 lines (37 loc) · 2.88 KB

README.md

File metadata and controls

59 lines (37 loc) · 2.88 KB

Semiconductor Test Library for DotNet

The semi-test-library-dotnet repository contains the source code for the Semiconductor Test Library written in C# using the .NET Framework.

For the latest release, visit the GitHub Releases page.

About

The Semiconductor Test Library simplifies programming on the NI Semiconductor Test System (STS) and enables users to develop test programs efficiently using C#/.NET.

The Semiconductor Test Library includes the following high-level features:

  • Interfaces and classes—Abstract instrument sessions and encapsulate the necessary pin and site awareness.
  • Pin- and site-aware data types— Simplify instrument configuration and measurement results processing.
  • Extension methods—Abstract common, high-level instrument operations.
  • Parallelization methods—Abstract parallel for loops required to iterate over multiple instrument sessions regardless of how sessions map to pins or sites.
  • Publishing methods—Simplify results publishing and add support for the SiteData and PinSiteData types.
  • Utilities methods—Provide utility methods commonly required for writing test code.
  • TestStand step types—Perform common operations, such as setting up and closing instruments, powering up a DUT, or executing common tests.

Software Requirements

You must have the following software to use the Semiconductor Test Library:

  • STS Software 24.5 or later
  • .NET Framework 4.8 or later

Visual Studio 2022 is highly recommended.

Documentation

A complete set of documentation for the Semiconductor Test Library can be found here: https://ni.github.io/semi-test-library-dotnet

Support

  • To report bug or make feature request specific to the Semiconductor Test Library, follow the process in Bugs / Feature Requests section below.
  • For general support using the Semiconductor Test Library contact NI Support.

Bugs / Feature Requests

To report a bug or submit a feature request specific to the Semiconductor Test Library, use the GitHub Issues page.

Fill in the issue template as completely as possible and we will respond as soon as we can.

Contributing

We welcome contributions! Follow these instructions to get started and contribute to the project.

License

semi-test-library-dotnet is licensed under an MIT-style license (see LICENSE.txt). Other incorporated projects may be licensed under different licenses.